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Specific Process Knowledge/Characterization/XRD/SLSII analysis: Difference between revisions

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===RS viewer===
===RS viewer===
RS viewer is an utility for simulating and viewing the reciprocal space for one or more materials at a time. In the old software this was called 'Diffraction Space Simulation'. The utility is handy for finding 2θ angles, and how to position the goniometer for measuring in screwed geometry. The RS viewer can be opened from either the measurement tan or the HRXRD tab, by clicking the button in at the ribbon.
RS viewer is an utility for simulating and viewing the reciprocal space for one or more materials at a time. In the old software this was called 'Diffraction Space Simulation'. The utility is handy for finding 2θ angles, and how to position the goniometer for measuring in screwed geometry. The RS viewer can be opened from either the measurement tan or the HRXRD tab, by clicking the button in at the ribbon.
In the RS viewer it is possible to make a sample model consisting of substrates and a number og layers on to. Unfortunately it is not possible to change the concentrations of different atoms in a composition as it is in the HRXRD sample building. But for each layer it is possible to change sample axis, eg. changing the substrate normal from (0 0 1) to (1 1 1). Using the RS viewer for setting up a Reciprocal space mapping (RSM) are done this way:
*Sample:
**Change the substrate to right material.
**Check that 'Normal Sz' under 'Sample Axes' is correct.
**Add layers by right clicking on an existing layer and click Insert New Layer.
**Configure added layer with material and expected orientation.
*Measurement:
**Chose the goniometer geometry wanted used in the measurement, often Inplane is wanted to avoid tilting the sample.
**Chose if the reflection is symmetric or asymmetric for Out of plane (ω step).
**Chose X-ray target as Cu-K&alpha;<sub>1</sub>.
*Reflection information:


==Texture==
==Texture==