Specific Process Knowledge/Characterization/XPS/NexsaOverview: Difference between revisions

Revision as of 15:56, 8 April 2020

Title	Type	Author	WOS link	XPS	UPS	ISS	REELS	Raman	Additional options/hardware
Publication	'	'	'	Techniques applied	'	'	'	'	'	Sample types/Materials	Description of application/Abstract
Multitechnique Surface Characterization of Organic LED Material	Application note	P Mack		X	X		X			Organic LED's	Abstract
Advantages of coincident XPS-Raman in the analysis of mineral oxides species	Application note			X				X		TiO2, CaCO3
Spectroscopic analysis of solid oxide fuel cell material with XPS	Application note	P Mack		X
Rapid XPS image acquisition using SnapMap	Application note	R Simpson		X					SnapMap
Composition, coverage and band gap analysis of ALD-grown ultra thin films	Application note	P Mack		X		X	X		Band gap	Gate dielectrics, HfO2, SiO2
Confirming the layer structure of an organic FET device	Application note	P Mack		X					MAGCIS	Organic FET's,
Surface analysis of zeolites: An XPS, variable kinetic energy XPS, and low energy ion scattering study	Publication	SR Bare	link	X		X				Zeolites, Metal oxides	Abstract
Surface composition analysis by low-energy ion scattering	Publication, background	H H Brongersma	link			X					Abstract
Monitoring surface metal oxide catalytic active sites with Raman spectroscopy	Publication, review	I E Wachs	link					X		Metal oxides	Abstract
Diffusion of In0.53Ga0.47As elements through hafnium oxide during post deposition annealing	Publication	W Cabrera	link	X		X			TEM	HfO2, InGaAs, ALD	Abstract
Low energy ion scattering (LEIS). A practical introduction to its theory, instrumentation, and applications	Publication, review	C V Cushman	link			X					Abstract
HfO2 on MoS2 by Atomic Layer Deposition: Adsorption Mechanisms and Thickness Scalability	Publication	S McDonnell	link	X		X			AFM, ALD	HfO2, MoS2	Abstract
Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS	Publication	S Prusa	link			X				graphene	Abstract
Reflection electron energy loss spectroscopy for ultrathin gate oxide materials	Publication	H C Shin	[1]	X			X		Valence band	HfZrO4,	Abstract
Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions	Publication	R Steinberger	link	X		X			AES, ARXPS, sputter profiles	Abstract
Electrochemical Characterization and Quantified Surface Termination Obtained by Low Energy Ion Scattering and X-ray Photoelectron Spectroscopy of Orthorhombic and Rhombohedral LaMnO3 Powders	Publication	E Symianakis		X		X			XRD	Catalysts, LaMnO3	Abstract
The Thermal Oxidation of TiAlN High Power Pulsed Magnetron Sputtering Hard Coatings as Revealed by Combined Ion and Electron Spectroscopy	Publication	M Wiesing	link	X	X	X			Ar sputtering	TiAlN	Abstract
Electronic structure and energy band gap of poly(9,9-dioctylfluorene) investigated by photoelectron spectroscopy	Publication	L S Liao	link	X	X					Polymer	Abstract
Electronic and optical properties of hafnium indium zinc oxide thin film by XPS and REELS	Publication	Y R Denny	link	X			X				Abstract

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-<span title="The only analytical option (that means excluded chillers, factory training courses, UPS etc) not chosen is a vacuum transfer module " >Absract</span>
-[http://apps.webofknowledge.com.proxy.findit.dtu.dk/CitedFullRecord.do?product=WOS&colName=WOS&SID=F6P8vdNQigRKywglhCq&search_mode=CitedFullRecord&isickref=WOS:000374198600054 link]
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