Specific Process Knowledge/Characterization/XRD/SLSII analysis: Difference between revisions
Created page with "=XRD data analysis in SmartLab Studio II= SmartLab Studio II is an integrated software package, combining all the functionality previously available in SmartLab Guidiance, Glo..." |
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The different packages available for data treatment is listed below. Compared to the old software it is more intuitive, as the package is in general named by the measurement type. The help functions included in the program in general gives a good overview of the options available when setting up fitting, please use them by clicking on the small question mark in the pane you want to know more about. | The different packages available for data treatment is listed below. Compared to the old software it is more intuitive, as the package is in general named by the measurement type. The help functions included in the program in general gives a good overview of the options available when setting up fitting, please use them by clicking on the small question mark in the pane you want to know more about. | ||
XRR | ==XRR== | ||
Gaining information about thin films with X-Ray Reflectivity, does like ellipsometry require some prior knowledge of the sample. In SLSII you create a layer structure with initial parameters. Then the software will fit the generated model to obtain the thickness, roughness, and density of your layers. | Gaining information about thin films with X-Ray Reflectivity, does like ellipsometry require some prior knowledge of the sample. In SLSII you create a layer structure with initial parameters. Then the software will fit the generated model to obtain the thickness, roughness, and density of your layers. | ||
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Data Visualization | ==Data Visualization== | ||
Data Manager | ==Data Manager== | ||
==Materials Manager== | |||
Materials Manager | |||