Specific Process Knowledge/Characterization/XPS/Nexsa: Difference between revisions

Revision as of 10:19, 3 April 2020

Feedback to this page: click here

The XPS Nexsa

Name: XPS Nexsa
Vendor: Thermofisher Scientific
The XPS Nexsa offers a variety of surface analysis techniques in addition to its main XPS technique.

The user manual(s), user APV(s), technical information and contact information are be found in LabManager:

The XPS Nexsa in LabManager

Process information

@@ Line 4: / Line 4: @@
 [[Category: Characterization|Chemical]]
-= The XPS Nexsa =
+'''Feedback to this page:
+[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/XPS/Nexsa  click here]'''
+[[Category: Equipment |Characterization chemical]]
+[[Category: Characterization|Chemical]]
+== The XPS Nexsa ==
+Name: XPS Nexsa<br>
+Vendor: Thermofisher Scientific<br>
+The XPS Nexsa offers a variety of surface analysis techniques in addition to its main XPS technique.
 '''The user manual(s), user APV(s), technical information and contact information are be found in LabManager:'''
@@ Line 11: / Line 20: @@
 <!-- give the link to the equipment info page in LabManager: -->
 [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=465  The XPS Nexsa in LabManager]
+== Process information ==
+*[[Specific Process Knowledge/Characterization/XPS/XPS technique|Short description of the XPS technique]]
+*[[Specific Process Knowledge/Characterization/XPS/ISS|Short description of Ion Scattering Spectroscopy (ISS)]]
+*[[Specific Process Knowledge/Characterization/XPS/REELS|Short description of Reflected Electron Energy Loss Spectroscopy (REELS)]]
+*[[Specific Process Knowledge/Characterization/XPS/Raman|Short description of Raman spectroscopy]]
+*[[Specific Process Knowledge/Characterization/XPS/UPS technique|Short description of Ultraviolet Photoelectron Spectroscopy (UPS) technique]]