LabAdviser/314/Preparation 314-307/Solid-matter/FIB-lamella: Difference between revisions
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Fig 2: Sketch of subsequent platinum deposition. | Fig 2: Sketch of subsequent platinum deposition. | ||
[[File:fig31.png| | [[File:fig31.png|400px]] | ||
[[File:fig32.png| | [[File:fig32.png|400px]] | ||
Fig 3: SE images acquired before and after electron beam deposited platinum. | Fig 3: SE images acquired before and after electron beam deposited platinum. | ||
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[[File:fig4.PNG| | [[File:fig4.PNG|500px]] | ||
Fig 4: Sketch of the desired rough cut and rough cleaning. | Fig 4: Sketch of the desired rough cut and rough cleaning. | ||
[[File:fig5_1.png| | [[File:fig5_1.png|400px]][[File:fig5_2.png|400px]] | ||
Fig 5: SE images acquired with the ion beam before and after the rough cut. | Fig 5: SE images acquired with the ion beam before and after the rough cut. | ||
[[File:fig6.png| | [[File:fig6.png|400px]] | ||
Fig 6: SE images acquired with the ion beam after the rough cleaning. | Fig 6: SE images acquired with the ion beam after the rough cleaning. | ||
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==Step 5: Undercut == | ==Step 5: Undercut == | ||
[[File:fig7.PNG| | [[File:fig7.PNG|500px]] | ||
Fig 7: Illustration of step 5-7. | Fig 7: Illustration of step 5-7. | ||
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[[File: | [[File:fig6.png|400px]] | ||
Fig 9: Attachment of the omni probe to a lamellae prior to cutting the lamellae free. | Fig 9: Attachment of the omni probe to a lamellae prior to cutting the lamellae free. | ||
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==Step 7: Attachment TEM grid== | ==Step 7: Attachment TEM grid== | ||
[[File:fig10.PNG| | [[File:fig10.PNG|400px]] | ||
Fig 10: Attachment of the omniprobe to the omniprobe grid. | Fig 10: Attachment of the omniprobe to the omniprobe grid. | ||
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==Step 8: Final thinning with Ga beam== | ==Step 8: Final thinning with Ga beam== | ||
[[File:fig11_1.png| | [[File:fig11_1.png|400px]][[File:fig11_2.png|400px]] | ||
Fig 11: Viewing directions during thinning. Left ion beam, right electron beam. | Fig 11: Viewing directions during thinning. Left ion beam, right electron beam. | ||