Specific Process Knowledge/Characterization/XRD/Process Info: Difference between revisions
| Line 10: | Line 10: | ||
===Theta-2Theta=== | ===Theta-2Theta=== | ||
A theta-2theta scan can be used for identifying peaks and hence lattice constants and possible crystal orientations. It will also be possible to say something about the materials of the crystal, but it is not suitable for identification of composition. If a multilayers structure is | A theta-2theta scan can be used for identifying peaks and hence lattice constants and possible crystal orientations. It will also be possible to say something about the materials of the crystal, but it is not suitable for identification of composition. If a multilayers structure is present a simulation of the structure and comparison to the measurement can help identify layer thicknesses, atomic ratios, and interface roughness’s. | ||
===Rocking curve=== | ===Rocking curve=== | ||