LabAdviser/314/Preparation 314-307/Solid-matter: Difference between revisions

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 <span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]]
+= Cutting =
+== Struers Minitom ==
+[http://www.struers.com/default.asp?doc_id=262  Brochure]
+[[File:IMG_3664.JPG|200px|left|thumb|Location Building 307, Prep Lab 109]]<br />
+<br clear="all" />
+== Well Precision Diamond Wire Saw ==
+[http://www.hititmetal.com/urun/metalografi/3000_seri.pdf  Brochure]
+[[File:IMG_3665.JPG|200px|left|thumb|Location Building 307, Prep Lab 109]]<br />
+<br clear="all" />
+= Grinding/Polishing =
+== Struers Labopol -25 ==
+[http://www.struers.com/default.asp?top_id=2&main_id=93&sub_id=145&doc_id=534  Brochure]
+[[File:labopol25.png|200px|left|thumb|Location Building 307, Prep Lab 109]]<br />
+<br clear="all" />
+== TechPrep Allied ==
+The MultiPrep™ System enables precise semiautomatic sample preparation of a wide range of materials for microscopic (optical, SEM, FIB, TEM, AFM, etc.) evaluation.
+Capabilities include parallel polishing, angle polishing, site-specific polishing or any combination thereof. It provides reproducible results by eliminating inconsistencies between users, regardless of their skill.
+[http://www.alliedhightech.com/Equipment/multiprep-polishing-system-8/ Brochure]
+[[File:TechPrep.png|200px]|left|thumb|Location Building 307, Prep Lab 109]]<br />
+<br clear="all" />
+== Struer Labopol -5 ==
+[[File:Labopol5.png|200px]|left|thumb|Location Building 307, Prep Lab 109]]<br />
+<br clear="all" />
+== Struer Labopol -4 ==
+[[File:Labopol4.png|200px|left|thumb|Location Building 307, Prep Lab 109]]<br />
+<br clear="all" />
+= Missing equipment =
+== Dimple grinder ==
+== Mini grinder/polisher ==
+== Ultrasonic cutter ==
+= Ion Milling =
+== Fischione Low Angle Ion Milling and Polishing System Model 1010 ==
+The Fischione Ion Mill is used for producing TEM specimens with large electron transparent areas. Samples are pre-thinned by e.g. mechanical grinding and polishing or chemical polishing. The milling or polishing is performed by argon ions. The instrument has two independently adjustable Hollow Anode Discharge (HAD) argon ion sources, which can be operated from 0.5 to 6.0 kV with currents from 3 mA to 8 mA. The milling angle can be adjusted in the range of 0° to 45°. Tuning the milling parameters allows for coarse or gentle milling and the goal is to get clean samples free of physical or chemical artifacts
+[[:File:Operation Manual Fischione_1010.pdf]]
+[[File:IMG_3674.JPG|300px|left|thumb|Location Building 307, Prep Lab 109]].<br />
+<br clear="all" />
+== Fischione NanoMill model 1040 ==
+This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.
+[http://www.fischione.com/products/ion-beam-preparation/model-1040-nanomill%C2%AE-tem-specimen-preparation-system Operation Manual]
+[[File:IMG_3679.JPG|250px|left|thumb|Location Building 314, Common Area]]
+<br clear="all" />
 '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Preparation_314-307/Solid-mater click here]'''