LabAdviser/314/Microscopy 314-307/SEM/AFEG: Difference between revisions
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* 2 nm at 30 keV for Au on C sample with the ETD detector | * 2 nm at 30 keV for Au on C sample with the ETD detector | ||
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!style="background:silver; color:black" align="center" valign="center" rowspan=" | !style="background:silver; color:black" align="center" valign="center" rowspan="6"|Instrument specifics | ||
|style="background:LightGrey; color:black"|Detectors | |style="background:LightGrey; color:black"|Detectors | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
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| style="background:LightGrey; color:black"|Allowed materials | | style="background:LightGrey; color:black"|Allowed materials | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
* Conductors, Semiconductors,Insulators, Prepared Biological | * Conductors, Semiconductors,Insulators, Prepared Biological ((not pathogents!) | ||
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