LabAdviser/314/Microscopy 314-307/TEM/ATEM

FEI Titan 80-300 ATEM

Titan ATEM in building 314.

Titan Analytical can be used in two conditions, transmission (TEM) and scanning transmission (STEM) modes. The point (interpretable) resolutions for TEM and STEM at 300 kV are 0.2 and 0.08 nm, respectively, which allows atomic arrangements in materials to be visualized clearly. EDS and EELS equipped to the microscope can be used for elemental analysis from regions that are as small as 1 nm. Specially, monochromated EELS, which is reachable to an energy resolution of 0.15 eV, allows the distribution of surface plasmons in nanostructured materials to be imaged at the nanometer scale and makes possible to determine the valence state of elements (e.g., Fe2+/Fe3+ ratios). This microscope is also dedicated to magnetic and electrostatic potential imaging since it has a biprism located at a selected-area aperture position and a Lorentz lens. This capability not only offers us to characterize magnetic materials and semiconductor devices but also may make possible to visualize different chemical states in low-density materials such as polymers and biological specimens.

Sample holders

The default specimen holders are a Fischione single-tilt tomography holder and an FEI double-tilt holder, which should be in the pumping station. The lab has also other specimen holders used for various application e.g. heating (furnace and MEMS-based), cooling, biasing and tomography. For information on the various specimen holders see HERE

Who may operate the Titan ATEM

In order to start training on the Titan ATEM you must by fully trained in the Tecnai TEM. Most of the basic operation on the Titan ATEM is the same as on the Tecnai with the added complexity of the aberration corrector and the monochromator.

Contact information can be found in LabManager

Titan ATEM in LabManager

Calibration

Calibration_collection angle_3Feb10

Comparison between TEMs at DTU Nanolab - building 307/314

Microscope		T12	T20	ATEM	ETEM
Purpose		TEM characterization Spectroscopic charaterization	TEM characterization STEM characterization Spectroscopic charaterization	High-resolution STEM imaging Analytical microscopy Holography	High-resolution TEM imaging ETEM experiments Spectroscopic charaterization
Resolution	TEM mode	>3.5 Å	1.44 Å	1.02 Å	0.9 Å
	STEM mode	no STEM	about 10 Å	0.8 Å	1.36 Å
Spectroscopy	EDX	Oxford X-Max 80T/AZtec	Oxford X-Max 80T/AZtec	Oxford X-Max 100TLE/AZtec	Oxford X-Max 80T/AZtec
	EELS	no EELS	Gatan 863 Tridiem GIF	Gatan 865 Tridiem GIF	Gatan 866 Tridiem GIF

Reference material

L. Reimer, Transmission Electron Microscopy - Physics of image formation and microanalysis (Springer, 1997).

David B. Williams, C. Barry Carter, Transmission Electron Microscopy - A Textbook for Materials Science (Springer, 2009).

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