LabAdviser/314/Microscopy 314-307/TEM: Difference between revisions
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==TEM | <span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]] | ||
= TEM = | |||
Transmission Electron Microscopy (TEM) is a technique, where accelerated electrons penetrate a thin sample and are collected on a detector. Dependenging on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses. | Transmission Electron Microscopy (TEM) is a technique, where accelerated electrons penetrate a thin sample and are collected on a detector. Dependenging on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses. | ||