Specific Process Knowledge/Thin film deposition/Deposition of Titanium Nitride: Difference between revisions
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Thin films of titanium nitride can only be deposited in the [[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)|ALD2]] at the moment. More information about the process can be found [[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)/TiN deposition using ALD2|here]]. | Thin films of titanium nitride can only be deposited in the [[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)|ALD2]] at the moment. More information about the process can be found [[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)/TiN deposition using ALD2|here]]. | ||
== | ==Comparison between sputtering and ALD methods for deposition of Titanium nitride.== | ||
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![[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)|ALD2]] | ![[Specific Process Knowledge/Thin film deposition/ALD2 (PEALD)|ALD2]] | ||
![[Specific Process Knowledge/Thin film deposition/Lesker|Sputter System Lesker]] | |||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
!Generel description | !Generel description | ||
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*Atomic Layer Deposition | *Atomic Layer Deposition | ||
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*Sputtering | |||
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|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
!Stoichiometry | !Stoichiometry | ||
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*TiN | *TiN | ||
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*TiN (can be tuned) | |||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
!Film Thickness | !Film Thickness | ||
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* 0nm - 50nm | * 0nm - 50nm | ||
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* 0nm - 200nm | |||
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|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
!Deposition rate | !Deposition rate | ||
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* 0.0173 nm/cycle on a flat sample | * 0.0173 nm/cycle on a flat sample | ||
* 0.0232 nm/cycle on a high aspect ratio structures | * 0.0232 nm/cycle on a high aspect ratio structures | ||
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* up to 0.0625 nm/s on a flat sample | |||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
!Step coverage | !Step coverage | ||
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*Very good | *Very good | ||
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*Not investigated | |||
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|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
!Process Temperature | !Process Temperature | ||
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* 450<sup>o</sup>C | * 450<sup>o</sup>C | ||
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* 400<sup>o</sup>C | |||
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|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
!Substrate size | !Substrate size | ||
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*1-5 100 mm wafers | *1-5 100 mm wafers | ||
*1-5 150 mm wafer | *1-5 150 mm wafer | ||
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*Several small samples | |||
*100 mm wafer | |||
*150 mm wafer | |||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
!'''Allowed materials''' | !'''Allowed materials''' | ||
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*III-V materials (use dedicated carrier wafer) | *III-V materials (use dedicated carrier wafer) | ||
*Polymers (depending on the melting point/deposition temperature, use carrier wafer) | *Polymers (depending on the melting point/deposition temperature, use carrier wafer) | ||
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*Silicon | |||
*Silicon oxide, silicon nitride | |||
*Quartz/fused silica | |||
*Metals | |||
*III-V materials (use dedicated carrier wafer) | |||
*Almost anything that is not toxic. | |||
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|} | |} | ||