Specific Process Knowledge/Characterization/XRD: Difference between revisions
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*Variable divergence slit | *Variable divergence slit | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
0.04° soller slit | *0.04° soller slit | ||
Ni and Cu filter | *Ni and Cu filter | ||
Divergence slits | *Divergence slits | ||
Beam mask | *Beam mask | ||
|- | |- | ||
|style="background:LightGrey; color:black"|Receiver side | |style="background:LightGrey; color:black"|Receiver side | ||
| Line 153: | Line 153: | ||
*Ge(220)x2 analyser | *Ge(220)x2 analyser | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
0.04° soller slit | *0.04° soller slit | ||
Ni filter | *Ni filter | ||
|- | |- | ||
!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates | !style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates | ||