Specific Process Knowledge/Characterization/Optical characterization: Difference between revisions
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==F10-RT reflectometer, transmitance, film thickness measurements [[Image:section under construction.jpg|70px]]== | ==F10-RT reflectometer, transmitance, film thickness measurements [[Image:section under construction.jpg|70px]]== | ||
[[image:|275x275px|right|thumb|F10-RT: positioned in cleanroom E-6]] | [[image:F10-RT.JPG|275x275px|right|thumb|F10-RT: positioned in cleanroom E-6]] | ||
F10-RT is a combined reflectometer transmittance measreument system that can also use the reflectance measurements to get the film thickness of transparent thin films. This system combines fiber-optic spectrophotometry with material modeling software to provide an affordable tool for the measurement of reflectance, transmitance and film thickness. | F10-RT is a combined reflectometer transmittance measreument system that can also use the reflectance measurements to get the film thickness of transparent thin films. This system combines fiber-optic spectrophotometry with material modeling software to provide an affordable tool for the measurement of reflectance, transmitance and film thickness. | ||