Specific Process Knowledge/Etch/DRIE-Pegasus: Difference between revisions
Appearance
| Line 156: | Line 156: | ||
* Bosch processes with etch and dep cycles each split into three | * Bosch processes with etch and dep cycles each split into three | ||
* Parameter ramping during process steps | * Parameter ramping during process steps | ||
* SOI option to reduce notching at buried | * SOI option to reduce notching at buried oxide layers | ||
* Picoscope monitoring | * Picoscope monitoring | ||
* Claritas endpoint detection system | * Claritas endpoint detection system | ||