Specific Process Knowledge/Back-end processing: Difference between revisions
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* Stylus profilometer measurements | * Stylus profilometer measurements | ||
**[[/Characterization/Profiler#Stylus_Profiler:_Dektak150|Stylus Profiler:Dektak150]] | **[[Specific Process Knowledge/Characterization/Profiler#Stylus_Profiler:_Dektak150|Stylus Profiler:Dektak150]] | ||
* Substrate/chip/die cleaning | * Substrate/chip/die cleaning | ||
**[[/Packlab Plasma Asher Pico 2|Packlab Plasma Asher Pico 2]] | **[[/Packlab Plasma Asher Pico 2|Packlab Plasma Asher Pico 2]] | ||