Jump to content

Specific Process Knowledge/Etch/ICP Metal Etcher/silicon oxide: Difference between revisions

Jmli (talk | contribs)
Jmli (talk | contribs)
Line 129: Line 129:
|Etch rate of thermal oxide
|Etch rate of thermal oxide
|
|
*'''145-172 nm/min''' ''by bghe@danchip (2015-06-02)''
*'''145-172 nm/min''' ''by bghe@nanolab (2015-06-02)''
*'''145 nm/min ''' ''by Martin Lind Ommen (fall 2016)''
*'''145 nm/min ''' ''by Martin Lind Ommen (fall 2016)''
|-
|-
|Selectivity to  resist [:1]
|Selectivity to  resist [:1]
| 4-5:1 (SiO2:resist) ''by bghe@danchip (2015-06-02)''
| 4-5:1 (SiO2:resist) ''by bghe@nanolab (2015-06-02)''
|-
|-
|Cr etch rate
|Cr etch rate
Line 139: Line 139:
|-
|-
|Profile [<sup>o</sup>]
|Profile [<sup>o</sup>]
|86-87 dg ''by bghe@danchip (2015-06-02)''
|86-87 dg ''by bghe@nanolab (2015-06-02)''
|-
|-
|Wafer uniformity map (click on the image to view a larger image)
|Wafer uniformity map (click on the image to view a larger image)