Specific Process Knowledge/Characterization/Four-Point Probe: Difference between revisions
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!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Substrates | !style="background:silver; color:black" align="center" valign="center" rowspan="2"|Substrates | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"|Small chips up to 8inch wafer | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"|4inch wafer or 6inch wafer | ||
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