Specific Process Knowledge/Back-end processing/Disco Saw: Difference between revisions

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[[Image:Disco_DAD_321_Dicer.jpg|500x500px|Dicer positioned on 1. floor bldg 346 room 157]]


'''The user manual, user APV, technical information and contact information can be found in LabManager:'''  
'''The user manual, user APV, technical information and contact information can be found in LabManager:'''  
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[[Image:Disco_DAD_321_Dicer.jpg|300x300px|thumb|Dicer positioned on 1. floor bldg 346 room 157|right]]


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Revision as of 15:54, 6 August 2019

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Disco Automatic dicing saw, model DAD321

The dicer feature versatile processing capabilities, compact designs, and high precision and reliability. Users perform workpiece loading, alignment, and unloading manually.

The dicer at DTU Nanolab is placed in room 157 on the first floor in bldg. 346. Please notice that this is not a cleanroom and that the dicing process is very dirty.

In general it is not allowed to bring back your samples into the Cleanroom. You need approval from DTU Nanolab staff to do this. Your samples have to be thoroughly cleaned in the gowning area and get a Piranha cleaning. You will only be allowed to use a limited number of tools for the processing after dicing.

Please consider your layout of dies on your wafer. The dicer can only cut straight lines across the wafer and you can not end a line in the middle of the wafer. Please see the illustrations for a good and a bad design.

Good design Bad design Bad design Dicer positioned on 1. floor bldg 346 room 157

The user manual, user APV, technical information and contact information can be found in LabManager:


Saw in LabManager

Process information


Overview of the performance Disco DAD321 Dicer

Purpose Equipment for dicing out samples
  • Pure Silicon samples
  • Silicon bonded to Silicon
  • Silicon bonded to Pyrex/Borofloat
  • Pyrex/Borofloat
Performance X-axis cutting range

192 mm

X-axis cut speed

0.1 - 300 mm/sec

Y-axis cutting range

162 mm

Y-axis index step

0.0002 mm

Y-axis single error

0.003 or less

Hardware settings Maximum blade size

ø76.2 mm

Substrates Substrate size

up to 6"

Layers that can't be diced
  • Thick metal (>0.75 mm)
  • III-V samples



Comparing dicing parameters for different materials

Silicon Pyrex or bonded Si/Pyrex
Bladetype HUB Blade ZH05 (27HEEF) HUBless Blade B1A862
Blade width 50 µm 150 µm
Cutlinewidth 60 µm 180 - 200 µm
Recommended feed speed Up to 20 mm/sec Up to 2 mm/sec (0.5 mm/sec)
Recommended dice depth Set blade height to 200µm (preferred).
This leaves 125µm uncut since blue tape is 75µm.
It is possible to cut through the sample.
Set blade height to 200µm (preferred).
This leaves 125µm uncut since blue tape is 75µm.
It is possible to cut through the sample.
Max. sample thickness 1.5 mm 2.0 mm

Images of diced samples

Si V-groove diced with ZH05 blade