Specific Process Knowledge/Thin film deposition/Deposition of Silicon: Difference between revisions
No edit summary |
|||
Line 1: | Line 1: | ||
'''Feedback to this page''': '''[mailto:labadviser@ | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=Specific_Process_Knowledge/Thin_film_deposition/Deposition_of_Silicon&action=edit click here]''' | ||
Line 7: | Line 7: | ||
==Deposition of PolySilicon using LPCVD== | ==Deposition of PolySilicon using LPCVD== | ||
DTU Nanolab has two furnaces for deposition of LPCVD (Low Chemical Vapour Deposition) polysilicon: A 6" furnace (installed in 2011) for deposition of standard polySi, amorphous polySi and boron doped polySi on 100 mm or 150 mm wafers and a 4" furnace (installed in 1995) for deposition of standard polySi, amorphous polySi, boron- and phosphorous doped polySi on 100 mm wafers. In LabManager the two furnaces are named "Furnace: LPCVD Poly-Si (4") (B4)" and "Furnace: LPCVD Poly-Si (6") (E2)", respectively. | |||
*[[Specific_Process_Knowledge/Thin_film_deposition/Deposition_of_polysilicon/Deposition_of_polysilicon_using_LPCVD/Standard_recipes,_QC_limits_and_results_for_the_4%22_polysilicon_furnace|Deposition of polysilicon using the 4" polysilicon furnace]] | *[[Specific_Process_Knowledge/Thin_film_deposition/Deposition_of_polysilicon/Deposition_of_polysilicon_using_LPCVD/Standard_recipes,_QC_limits_and_results_for_the_4%22_polysilicon_furnace|Deposition of polysilicon using the 4" polysilicon furnace]] | ||
Line 40: | Line 40: | ||
! General description | ! General description | ||
|LPCVD (low pressure | |LPCVD (low pressure chemical vapour deposition) of polysilicon | ||
| Sputter deposition of Si. | | Sputter deposition of Si. | ||
Line 83: | Line 83: | ||
| | | | ||
*undoped, boron doped:~100Å/min | *undoped, boron doped:~100Å/min | ||
* | *Phosphorous doped:~20Å/min | ||
| | | | ||
In the order of 1 Å/s, but | In the order of 1 Å/s, but dependent on process parameters. See more [[Specific Process Knowledge/Thin film deposition/Si sputter in Wordentec|here.]] | ||
| About 5 nm/min. See more [[Specific_Process_Knowledge/Etch/IBE⁄IBSD_Ionfab_300/IBSD_of_Si|here.]] | | About 5 nm/min. See more [[Specific_Process_Knowledge/Etch/IBE⁄IBSD_Ionfab_300/IBSD_of_Si|here.]] | ||
| Depends on process parameters, roughly 1 Å/s. | | Depends on process parameters, roughly 1 Å/s. |
Revision as of 15:30, 25 November 2019
Feedback to this page: click here
PolySilicon can be deposited in several Danchip tools. It can be sputtered, e-beam evaporated or be deposited in the PolySilicon furnaces. In the chart below you can compare the different deposition methods:
Deposition of PolySilicon using LPCVD
DTU Nanolab has two furnaces for deposition of LPCVD (Low Chemical Vapour Deposition) polysilicon: A 6" furnace (installed in 2011) for deposition of standard polySi, amorphous polySi and boron doped polySi on 100 mm or 150 mm wafers and a 4" furnace (installed in 1995) for deposition of standard polySi, amorphous polySi, boron- and phosphorous doped polySi on 100 mm wafers. In LabManager the two furnaces are named "Furnace: LPCVD Poly-Si (4") (B4)" and "Furnace: LPCVD Poly-Si (6") (E2)", respectively.
- Deposition of polysilicon using the 4" polysilicon furnace
- Deposition of polysilicon using the 6" polysilicon furnace
Deposition of Silicon using sputter deposition technique
At Nanolab you can also deposit silicon the using Wordentec, the Lesker Sputter system or the IBE Ionfab300 sputter systems. One of the advantages here is that you can deposit on any material you like.
Deposition of Silicon using PECVD
At Nanolab you can also deposit silicon the using PECVD. The deposition temperature is 300 oC.
Comparison of the methods for deposition of Silicon
4" and 6" Furnace PolySi (Furnace LPCVD PolySi) | Sputter (Wordentec) | Sputter (IBE/IBSD Ionfab 300) | Sputter (Lesker) | E-beam evaporation (III-V Dielectric evaporator) | PECVD (PECVD) | |
---|---|---|---|---|---|---|
General description | LPCVD (low pressure chemical vapour deposition) of polysilicon | Sputter deposition of Si. | Ion beam sputter deposition of Si. | Sputter deposition of Si. | E-beam evaporation of Si. | Plasma Enhanced Chemical Vapor Deposition. |
Doping facility | Can be doped with boron or phosphorus during deposition | None | None | None | None | Yes, B and P |
Pre-clean | New wafers can go directly into the furnace. Processed wafers have to be RCA cleaned | RF Ar clean | None | RF Ar clean | ||
Layer thickness | ~50Å to 2µm, if thicker layers are needed please ask the furnace team. | 10Å to about 3000Å | No defined limits | 10Å to 2500Å | few nm to ~500nm | |
Deposition rate |
|
In the order of 1 Å/s, but dependent on process parameters. See more here. |
About 5 nm/min. See more here. | Depends on process parameters, roughly 1 Å/s. | 1Å/s to 5Å/s (see below). | ~6Å/s can probably be higher |
Process temperature | 560 oC (amorph) and 620 oC (poly) | ? | Platen: 5-60 oC | Wafers can be heated to 100-200°C | 20-250 oC | 300 oC |
Step coverage | Good | . | Not known | Poor | Medium | |
Adhesion | Good for fused silica, silicon oxide, silicon nitride, silicon | . | Not tested | Not tested, but do not deposit on top of silicon | ||
Batch size |
|
|
|
|
|
|
Allowed substrates |
|
|
|
|
|
See the cross contamination sheet for PECVD3 |
Allowed material | Only those above (under allowed substrates). |
|
|
|
|
See the cross contamination sheet for PECVD3 |
Comment | The system is used both for IBSD and IBE. Si deposition can only be performed when it is set up for IBSD. | Only in PECVD3 |