Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300/SIMS settings: Difference between revisions
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''Made by bghe@nanolab in 2015'' | ''Made by bghe@nanolab in 2015'' |
Revision as of 14:46, 18 August 2021
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Made by bghe@nanolab in 2015
SIMS setting for different materials | ||
Lower plate | Upper plate | |
---|---|---|
Ti | -1 | |
Si | -1 | (2) |
Al | -1 | 1 |
Cr | -1 | |
Ni | -6 |