Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/KPFM: Difference between revisions
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'''Feedback to this page''': '''[mailto:labadviser@ | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/AFM:_Atomic_Force_Microscopy/KPFM click here]''' | ||
''By Berit Herstrøm @ | ''By Berit Herstrøm @nanolab January 2018'' | ||
KPFM (Kelvin Probe Force Microscopy) measurements can be done with this AFM Icon. It is best for mapping the surface potential on a sample with nanometer resolution but it can also be calibrated to give quantitative values. | KPFM (Kelvin Probe Force Microscopy) measurements can be done with this AFM Icon. It is best for mapping the surface potential on a sample with nanometer resolution but it can also be calibrated to give quantitative values. | ||
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To get the work function of the your sample of interest, you need to find the work function of the tip as what you measure with KPFM is the work function difference between the tip and the sample. | To get the work function of the your sample of interest, you need to find the work function of the tip as what you measure with KPFM is the work function difference between the tip and the sample. | ||
Measured surface potential = Work | Measured surface potential = Work function (Tip) - Work function (sample) | ||
So | So | ||
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Work function (Tip) = Measured surface potential*e + Work function (sample) | Work function (Tip) = Measured surface potential*e + Work function (sample) | ||
When | When measuring on the gold to find the work function of the tip: | ||
Work function (Tip) = Measured surface potential*e + 5.10eV | Work function (Tip) = Measured surface potential*e + 5.10eV | ||