Jump to content

Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions

← Older editNewer edit →
VisualWikitext
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,311 edits
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,311 edits
Line 138: Line 138:
|style="background:silver; color:black"|
|style="background:silver; color:black"|
|style="background:LightGrey; color:black"|Super Sharp Si Cantilever/tip
|style="background:LightGrey; color:black"|Super Sharp Si Cantilever/tip
|style="background:WhiteSmoke; color:black"|[http://www.nanoandmore.com/AFM-Probe-SSS-NCHR.html SSS-NCHR]
|style="background:WhiteSmoke; color:black"|[http://www.nanoandmore.com/AFM-Probe-SSS-NCHR SSS-NCHR]
|-
|-
|style="background:silver; color:black"|
|style="background:silver; color:black"|
Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=Specific_Process_Knowledge/Characterization/AFM:_Atomic_Force_Microscopy"