Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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*Adhesion | *Adhesion | ||
*Deformation | *Deformation | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black" valign="top"| | ||
*Surface roughness measurement | *Surface roughness measurement | ||
*Step/structure hight measurement | *Step/structure hight measurement | ||