Specific Process Knowledge/Characterization: Difference between revisions
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*[[LabAdviser/CEN/Titan ETEM |Titan ETEM]] | *[[LabAdviser/CEN/Titan ETEM |Titan ETEM]] | ||
*[[LabAdviser/CEN/Tecnai TEM |Tecnai TEM]] | *[[LabAdviser/CEN/Tecnai TEM |Tecnai TEM]] | ||
===Electrical measurements=== | |||
*[[/4-Point Probe|4-Point Probe]] | |||
*[[/Probe station|Probe station]] | |||
*[[/III-V ECV-profiler|III-V ECV-profiler (Electrochemical Capacitance-Voltage carrier density profiler)]] | |||
===Various=== | ===Various=== | ||
*[[/Drop Shape Analyzer|Drop Shape Analyzer]] | *[[/Drop Shape Analyzer|Drop Shape Analyzer]] | ||
*[[/Thickness Measurer|Thickness Measurer]] | *[[/Thickness Measurer|Thickness Measurer]] | ||
*[[/DSC Perkin Elmer|DSC Perkin Elmer - Differential Scanning Calorimetry]] | *[[/DSC Perkin Elmer|DSC Perkin Elmer - Differential Scanning Calorimetry]] | ||
*[[/Hardness measurement|Hardness tester]] | *[[/Hardness measurement|Hardness tester]] | ||
*[[/KLA-Tencor Surfscan 6420|KLA-Tencor Surfscan 6420]] | *[[/KLA-Tencor Surfscan 6420|KLA-Tencor Surfscan 6420]] | ||
*[[/X-Ray Diffractometer|X-Ray Diffractometer ]] | *[[/X-Ray Diffractometer|X-Ray Diffractometer ]] | ||
*[[/XRD|XRD SmartLab]] | *[[/XRD|XRD SmartLab]] | ||