Specific Process Knowledge/Characterization/XPS/Processing/ALDSandwich1: Difference between revisions
No edit summary |
|||
| Line 1: | Line 1: | ||
= XPS analysis of ALD deposited layers = | = XPS analysis of ALD deposited layers = | ||
[[File:Experiment 2.xls]] | == How to get the data used in the example below == | ||
The wiki does not allow uploading of *.zip data files so the zipped data file has been renamed to a *.xls file. Therefore, do the following: | |||
# Download this file [[File:Experiment 2.xls]]. | |||
# Rename the Experiment_2.''zip'' to Experiment_2.''zip'' | |||
# Extract to a folder on a local drive. Avantage will not work on network drives. | |||
# Double click on the ''Experiment 2.VGX'' file and Avantage should start. | |||
== How to fit data with multiple spectra and levels == | == How to fit data with multiple spectra and levels == | ||
Revision as of 14:15, 15 October 2018
XPS analysis of ALD deposited layers
How to get the data used in the example below
The wiki does not allow uploading of *.zip data files so the zipped data file has been renamed to a *.xls file. Therefore, do the following:
- Download this file File:Experiment 2.xls.
- Rename the Experiment_2.zip to Experiment_2.zip
- Extract to a folder on a local drive. Avantage will not work on network drives.
- Double click on the Experiment 2.VGX file and Avantage should start.
How to fit data with multiple spectra and levels
- Use one processing grid to hold all spectra to be fitted.
- Each processing grid has a peak table that holds all the peaks for each level. Making depth profiles cannot be made across processing grids. Survey spectra must be kept in separate grids - if not the peak table of the survey spectrum will get mixed with the high resolution spectra.
- Do not mix snapshot and scanned spectra in processing grid