Specific Process Knowledge/Characterization: Difference between revisions
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| align="center" style="background:#f0f0f0;"|'''''' | | align="center" style="background:#f0f0f0;"|'''''' | ||
| | | align="center" style="background:#f0f0f0;"|'''Microscopes''' | ||
| align="center" style="background:#f0f0f0;"|'''SEM (incl. EDX)''' | |||
| align="center" style="background:#f0f0f0;"|'''AFM''' | |||
| align="center" style="background:#f0f0f0;"|'''Stylus profiler''' | |||
| align="center" style="background:#f0f0f0;"|'''Optical profiler''' | |||
| align="center" style="background:#f0f0f0;"|'''Filmtek (reflectometer)''' | |||
| align="center" style="background:#f0f0f0;"|'''Ellipsometer''' | |||
| align="center" style="background:#f0f0f0;"|'''Thickness stylus''' | |||
| align="center" style="background:#f0f0f0;"|'''XPS''' | |||
| align="center" style="background:#f0f0f0;"|'''PL mapper''' | |||
| align="center" style="background:#f0f0f0;"|'''4-point probe''' | |||
| align="center" style="background:#f0f0f0;"|'''Probe station''' | |||
| align="center" style="background:#f0f0f0;"|'''XRD''' | |||
| align="center" style="background:#f0f0f0;"|'''Life time scanner''' | |||
| align="center" style="background:#f0f0f0;"|'''Drop shape analyser''' | |||
| align="center" style="background:#f0f0f0;"|'''Hardness tester''' | |||
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