Specific Process Knowledge/Thin film deposition/Temescal: Difference between revisions
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'''*''' ''For thicknesses above 600 nm please request permission so we can ensure that enough material will be present.'' | '''*''' ''For thicknesses above 600 nm please request permission so we can ensure that enough material will be present.'' | ||
'''**''' ''Defined as the ratio of the standard deviation to the average of the measurement made using the DektakXT'' | '''**''' ''Defined as the ratio of the standard deviation to the average of the measurement made using the DektakXT. For further details see the acceptance test.'' | ||
==Quality control (QC) for the Temescal== | ==Quality control (QC) for the Temescal== | ||