Specific Process Knowledge/Etch/III-V ICP/InP-InGaAsP-InGaAs: Difference between revisions

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===Etching of an InP piece on SiO2 carrier===
===Etching of an InP piece on SiO2 carrier===
InP piece patterned with SiO2. The piece was etched on top of a Si wafer coated with SiO2 without bonding. The recipe "InP etch" was used. The roughness looks low in the bottom of the etched areas, even in the large open areas.
InP piece patterned with SiO2. The piece was etched on top of a Si wafer coated with SiO2 without bonding. The recipe "InP etch" was used. The roughness looks low in the bottom of the etched areas, even in the large open areas.
<gallery>
<gallery caption="Result of InP etching."  widths="500px" heights="400px" perrow="3">


Image:S4_00.jpg
Image:S4_00.jpg

Revision as of 13:26, 19 June 2018

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InP/InGaAsP/InGaAs etch

Unselective etch for large sized features and small aspect ratios by David Larsson, DTU Photonics, 2011

Recipe InP Etch 1/InP Precond 1
Cl2 flow 20 sccm
N2 flow 40 sccm
Ar flow 10 sccm
Platen power 100 W
Coil power 500 W
Pressure 2 mTorr
Platen chiller temperature 180 oC


Results (InP Etch 1)
Etch rate 500-600 nm/min
Sidewall angle 86-87 o
Selectivity (InP:SiO2, InP:HSQ) 50:1
  • Result of InP etching. David Larsson, DTU Photonics, 2011

InP etching June 2018

Etching of an InP piece on Si carrier

InP piece patterned with SiO2. The piece was etched on top of a Si wafer without bonding. The recipe "InP etch" was used. The roughness looks high in the bottom of the etched areas, especially in the large open areas.

  • Result of InP etching.
  • low roughness in narrow trenched
    low roughness in narrow trenched
  • low roughness in narrow trenched
    low roughness in narrow trenched
  • A little higher roughnedd is larger trences
    A little higher roughnedd is larger trences
  • Much larger roughness in open areas
    Much larger roughness in open areas
  • Zoom in on the large roughness
    Zoom in on the large roughness
  • closed look at the large roughness in the open areas.
    closed look at the large roughness in the open areas.


Etching of an InP piece on SiO2 carrier

InP piece patterned with SiO2. The piece was etched on top of a Si wafer coated with SiO2 without bonding. The recipe "InP etch" was used. The roughness looks low in the bottom of the etched areas, even in the large open areas.

  • Result of InP etching.
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