Specific Process Knowledge/Characterization/XPS/XPS elemental composition: Difference between revisions
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[[File:Overview spectra Labadvisor.JPG|600px|XPS spectrum of a sample consisting of the elements silicon, oxygen and carbon. ]] | [[File:Overview spectra Labadvisor.JPG|600px|XPS spectrum of a sample consisting of the elements silicon, oxygen and carbon. ]] | ||
With a unique set of electronic states, each element has its own specific "finger-print" in the XPS spectrum. | |||
In the table below, one can see the set | |||
in atoms are different for all elements, and when measuring a photoelectron spectrum over a wide range of energies, the main line from each element will be placed at a specific energy in the spectrum. | |||
Here is shown a spectrum measured over the energy range 0-1350 eV, and characteristic lines from three elements (C,O and Si) are seen and indicated in the spectrum. | Here is shown a spectrum measured over the energy range 0-1350 eV, and characteristic lines from three elements (C,O and Si) are seen and indicated in the spectrum. | ||