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'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/AFM:_Atomic_Force_Microscopy/KPFM click here]'''
'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/AFM:_Atomic_Force_Microscopy/KPFM click here]'''
''By Berit Herstrøm @danchip January 2018''


KPFM (Kelvin Probe Force Microscopy) measurements can be done with this AFM Icon. It is best for mapping the surface potential on a sample with nanometer resolution but it can also be calibrated to give quantitative values.
KPFM (Kelvin Probe Force Microscopy) measurements can be done with this AFM Icon. It is best for mapping the surface potential on a sample with nanometer resolution but it can also be calibrated to give quantitative values.
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