Specific Process Knowledge/Thermal Process/Annealing: Difference between revisions
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| valign="top" align="center" style="background:#f0f0f0;"|'''A1 <br /> Boron drive-in''' | | valign="top" align="center" style="background:#f0f0f0;"|'''A1 <br /> Boron drive-in''' | ||
| valign="top" align="center" style="background:#f0f0f0;"|'''A3 <br />Phosphorous drive-in''' | | valign="top" align="center" style="background:#f0f0f0;"|'''A3 <br />Phosphorous drive-in''' | ||
| valign="top" align="center" style="background:#f0f0f0;"|'''C1 <br /> | | valign="top" align="center" style="background:#f0f0f0;"|'''C1 <br />Anneal oxide''' | ||
| valign="top" align="center" style="background:#f0f0f0;"|'''C2 <br /> | | valign="top" align="center" style="background:#f0f0f0;"|'''C2 <br />Gate oxide''' | ||
| valign="top" align="center" style="background:#f0f0f0;"|'''C3 <br />Anneal bond''' | | valign="top" align="center" style="background:#f0f0f0;"|'''C3 <br />Anneal bond''' | ||
| valign="top" align="center" style="background:#f0f0f0;"|'''C4 <br />Anneal aluminium''' | | valign="top" align="center" style="background:#f0f0f0;"|'''C4 <br />Anneal aluminium''' | ||
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|-valign="top" | |-valign="top" | ||
! General description | ! General description | ||
|Drive-in of boron deposited in the boron pre-dep furnace(A2) or drive-in of ion implanted boron. Can also be used for oxidation.||Drive-in of phosphorous deposited in the phosphorous pre-dep furnace(A2) or drive-in of ion implanted phosphorous. Can also be used for oxidation.|| | |Drive-in of boron deposited in the boron pre-dep furnace(A2) or drive-in of ion implanted boron. Can also be used for oxidation.||Drive-in of phosphorous deposited in the phosphorous pre-dep furnace(A2) or drive-in of ion implanted phosphorous. Can also be used for oxidation.||Annealing and oxidation of wafers from the B-stack and PECVD1. At the moment also used for general annealing and oxidation of 6" wafers.||Oxidation of gate-oxide and other especially clean oxides.||Annealing and oxidation of wafers from NIL.||Annealing of wafers with aluminium.||Annealing and oxidation of any material.||Rapid thermal annealing. | ||
|- | |- | ||
! Annealing with N<math>_2</math> | ! Annealing with N<math>_2</math> | ||
|x||x||x (with special permission) | |x||x||x||x (with special permission)||x||x||x||x | ||
|- | |- | ||
!Wet annealing with bubler (water steam + N<math>_2</math>) | !Wet annealing with bubler (water steam + N<math>_2</math>) | ||
|.||.|| | |.||.||x||.||x||.||.||. | ||
|- | |- | ||
!Process temperature [ <sup>o</sup>C ] | !Process temperature [ <sup>o</sup>C ] | ||
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| valign="top" align="center" style="background:#f0f0f0;"|'''A1 <br />Boron drive-in''' | | valign="top" align="center" style="background:#f0f0f0;"|'''A1 <br />Boron drive-in''' | ||
| valign="top" align="center" style="background:#f0f0f0;"|'''A3 <br />Phosphorous drive-in''' | | valign="top" align="center" style="background:#f0f0f0;"|'''A3 <br />Phosphorous drive-in''' | ||
| valign="top" align="center" style="background:#f0f0f0;"|'''C1 <br /> | | valign="top" align="center" style="background:#f0f0f0;"|'''C1 <br />Anneal oxide''' | ||
| valign="top" align="center" style="background:#f0f0f0;"|'''C2 <br /> | | valign="top" align="center" style="background:#f0f0f0;"|'''C2 <br />Gate oxide''' | ||
| valign="top" align="center" style="background:#f0f0f0;"|'''C3 <br />Anneal bond''' | | valign="top" align="center" style="background:#f0f0f0;"|'''C3 <br />Anneal bond''' | ||
| valign="top" align="center" style="background:#f0f0f0;"|'''C4 <br />Anneal aluminium''' | | valign="top" align="center" style="background:#f0f0f0;"|'''C4 <br />Anneal aluminium''' | ||
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| valign="top" align="center" style="background:#f0f0f0;"|'''RTP''' | | valign="top" align="center" style="background:#f0f0f0;"|'''RTP''' | ||
|- | |- | ||
| New clean* Si wafers 4" (6" in C1)||x||x||x (with special permission) | | New clean* Si wafers 4" (6" in C1)||x||x||x||x (with special permission)||x||x||x||x | ||
|- | |- | ||
| RCA clean** Si wafers with no history of Metals on||x||x||x (with special permission) | | RCA clean** Si wafers with no history of Metals on||x||x||x||x (with special permission)||x||x||x||x | ||
|- | |- | ||
| From Predep furnace directly (e.g. incl. Predep HF**)||From A2||From A4|| | | From Predep furnace directly (e.g. incl. Predep HF**)||From A2||From A4||x||.||x||x||x||x | ||
|- | |- | ||
| Wafers directly from PECVD1||.||.|| | | Wafers directly from PECVD1||.||.||x||.||x||x||x||x | ||
|- | |- | ||
| Wafers directly from NIL bonding||.||.||.||.||x||x||x||x | | Wafers directly from NIL bonding||.||.||.||.||x||x||x||x |
Revision as of 13:27, 15 September 2011
Annealing
At Danchip we have seven furnaces and an RTP for annealing: A1,A3,C1,C2,C3,C4, noble furnace and RTP. Annealing normally takes place in an N atmosphere. PECVD PBSG is annealed in an wet atmosphere which will also oxidize the silicon substrate.
- Anneal with N can be done in furnaces:A1,A3,C1,C2,C3,C4, noble furnace and RTP
- Wet anneal with HO in a bubbler can be done in furnaces:C2 and C3.
Comparison of the seven annealing equipments
A1 Boron drive-in |
A3 Phosphorous drive-in |
C1 Anneal oxide |
C2 Gate oxide |
C3 Anneal bond |
C4 Anneal aluminium |
Nobel furnace | RTP | |
General description | Drive-in of boron deposited in the boron pre-dep furnace(A2) or drive-in of ion implanted boron. Can also be used for oxidation. | Drive-in of phosphorous deposited in the phosphorous pre-dep furnace(A2) or drive-in of ion implanted phosphorous. Can also be used for oxidation. | Annealing and oxidation of wafers from the B-stack and PECVD1. At the moment also used for general annealing and oxidation of 6" wafers. | Oxidation of gate-oxide and other especially clean oxides. | Annealing and oxidation of wafers from NIL. | Annealing of wafers with aluminium. | Annealing and oxidation of any material. | Rapid thermal annealing. |
---|---|---|---|---|---|---|---|---|
Annealing with N | x | x | x | x (with special permission) | x | x | x | x |
Wet annealing with bubler (water steam + N) | . | . | x | . | x | . | . | . |
Process temperature [ oC ] | 800-1150 | 800-1150 | 800-1150 | 800-1150 | 800-1150 | 800-1150 | 22-1000oC | ? |
Batch size | max. 30 wafers of 4" or 2" | max. 30 4" wafers or 2" wafers | max. 30 wafers of 6",4" or 2" | max. 30 4" wafers or 2" wafers | max. 30 4" wafers or 2" wafers | max. 30 4" wafers or 2" wafers | 30x4" or small pieces | ? |
Which wafers are allowed to enter the furnace: | A1 Boron drive-in |
A3 Phosphorous drive-in |
C1 Anneal oxide |
C2 Gate oxide |
C3 Anneal bond |
C4 Anneal aluminium |
Nobel | RTP |
New clean* Si wafers 4" (6" in C1) | x | x | x | x (with special permission) | x | x | x | x |
RCA clean** Si wafers with no history of Metals on | x | x | x | x (with special permission) | x | x | x | x |
From Predep furnace directly (e.g. incl. Predep HF**) | From A2 | From A4 | x | . | x | x | x | x |
Wafers directly from PECVD1 | . | . | x | . | x | x | x | x |
Wafers directly from NIL bonding | . | . | . | . | x | x | x | x |
Wafers with aluminium | . | . | . | . | . | x | x | . |
wafers with other metals | . | . | . | . | . | . | x | . |
wafers with III-V materials | x |
*New clean: only right from the new clean box. It is not allowed to put them in another box first.
**These wafers must be placed in a "transport box from RCA to furnace" using the RCA carrier when doing RCA or the pre-dep carrier after pre-dep.