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Specific Process Knowledge/Thermal Process/Oxidation: Difference between revisions

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| valign="top" align="center" style="background:#f0f0f0;"|'''A1 <br />Boron drive-in'''
| valign="top" align="center" style="background:#f0f0f0;"|'''A1 <br />Boron drive-in'''
| valign="top" align="center" style="background:#f0f0f0;"|'''A3 <br />Phosphorous drive-in'''
| valign="top" align="center" style="background:#f0f0f0;"|'''A3 <br />Phosphorous drive-in'''
| valign="top" align="center" style="background:#f0f0f0;"|'''C1 <br />Gate oxide'''
| valign="top" align="center" style="background:#f0f0f0;"|'''C1 <br />Anneal oxide'''
| valign="top" align="center" style="background:#f0f0f0;"|'''C2 <br />Anneal oxide'''
| valign="top" align="center" style="background:#f0f0f0;"|'''C2 <br />Gate oxide'''
| valign="top" align="center" style="background:#f0f0f0;"|'''C3 <br />Anneal bond'''
| valign="top" align="center" style="background:#f0f0f0;"|'''C3 <br />Anneal bond'''
| valign="top" align="center" style="background:#f0f0f0;"|'''D1 <br />APOX'''
| valign="top" align="center" style="background:#f0f0f0;"|'''D1 <br />APOX'''
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|-valign="top"
|-valign="top"
! General description
! General description
|Drive-in of boron deposited in the boron pre-dep furnace(A2) or drive-in of ion implanted boron. Can also be used for dry and wet oxidation.||Drive-in of phosphorous deposited in the phosphorous pre-dep furnace(A2) or drive-in of ion implanted phosphorous. Can also be used for dry and wet oxidation.||Oxidation of gate-oxide and other especially clean oxides. At the moment also used for general oxidation of 6" wafers.||Oxidation and annealing of wafers from the B-stack and PECVD1.||Oxidation and annealing of wafers from NIL.||Oxidation of very thick oxides||Oxidation and annealing for all materials.
|Drive-in of boron deposited in the boron pre-dep furnace(A2) or drive-in of ion implanted boron. Can also be used for dry and wet oxidation.||Drive-in of phosphorous deposited in the phosphorous pre-dep furnace(A2) or drive-in of ion implanted phosphorous. Can also be used for dry and wet oxidation.||Oxidation and annealing of wafers from the B-stack and PECVD1.||Oxidation of gate-oxide and other especially clean oxides. At the moment also used for general oxidation of 6" wafers.||Oxidation and annealing of wafers from NIL.||Oxidation of very thick oxides||Oxidation and annealing for all materials.
|-
|-
! Dry oxidation
! Dry oxidation
|x||x||x (with special permission)||x||x||.||x (after request)
|x||x||x||x(with special permission)||x||.||x (after request)
|-
|-
!wet oxidation with torch (H<math>_2</math>+O<math>_2</math>)
!wet oxidation with torch (H<math>_2</math>+O<math>_2</math>)
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|-
|-
!Wet oxidation with bubbler (water steam + N<math>_2</math>)
!Wet oxidation with bubbler (water steam + N<math>_2</math>)
|.||.||x (with special permission)||x||x||x||.
|.||.||x||x (with special permission)||x||x||.
|-
|-
!Process temperature [ <sup>o</sup>C ]
!Process temperature [ <sup>o</sup>C ]
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|-
|-
!Cleanliness of dry oxide (rated 1-5, 1 is best)
!Cleanliness of dry oxide (rated 1-5, 1 is best)
|2||2||1||3||4||.||>5
|2||2||3||1||4||.||>5
|-
|-
!Cleanliness of wet oxide (rated 1-4, 1 is best)
!Cleanliness of wet oxide (rated 1-4, 1 is best)
|1||1||2||3||4||3||.
|1||1||3||2||4||3||.
|-valign="top"
|-valign="top"
! Batch size
! Batch size
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| align="center" style="background:#f0f0f0;"|'''A1 <br />Boron drive-in'''
| align="center" style="background:#f0f0f0;"|'''A1 <br />Boron drive-in'''
| align="center" style="background:#f0f0f0;"|'''A3 <br />Phosphorous drive-in'''
| align="center" style="background:#f0f0f0;"|'''A3 <br />Phosphorous drive-in'''
| align="center" style="background:#f0f0f0;"|'''C1 <br />Gate oxide'''
| align="center" style="background:#f0f0f0;"|'''C1 <br />Anneal oxide'''
| align="center" style="background:#f0f0f0;"|'''C2 <br />Anneal oxide'''
| align="center" style="background:#f0f0f0;"|'''C2 <br />Gate oxide'''
| align="center" style="background:#f0f0f0;"|'''C3 <br />Anneal bond'''
| align="center" style="background:#f0f0f0;"|'''C3 <br />Anneal bond'''
| align="center" style="background:#f0f0f0;"|'''D1 <br />APOX'''
| align="center" style="background:#f0f0f0;"|'''D1 <br />APOX'''
| align="center" style="background:#f0f0f0;"|'''Noble'''
| align="center" style="background:#f0f0f0;"|'''Noble'''
|-
|-
| New clean* Si wafers 4" (6" in C1)||x||x||x (with special permission)||x||x||x||x
| New clean* Si wafers 4" (6" in C1)||x||x||x||x (with special permission)||x||x||x
|-
|-
| RCA clean** Si wafers with no history of Metals on||x||x||x (with special permission)||x||x||.||x
| RCA clean** Si wafers with no history of Metals on||x||x||x||x (with special permission)||x||.||x
|-
|-
| From Predep furnace  directly (e.g. incl. Predep HF**)||From A2||From A4||.||x||x||.||x
| From Predep furnace  directly (e.g. incl. Predep HF**)||From A2||From A4||x||.||x||.||x
|-
|-
| Wafers directly from PECVD1||.||.||.||x||x||.||x
| Wafers directly from PECVD1||.||.||x||.||x||.||x
|-
|-
| Wafers directly from NIL bonding||.||.||.||.||x||.||x
| Wafers directly from NIL bonding||.||.||.||.||x||.||x