Specific Process Knowledge/Thin film deposition/Deposition of Silicon: Difference between revisions
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! 4" and 6" Furnace PolySi ([[Specific Process Knowledge/Thin film deposition/Furnace LPCVD PolySilicon|Furnace LPCVD PolySi]]) | ! 4" and 6" Furnace PolySi ([[Specific Process Knowledge/Thin film deposition/Furnace LPCVD PolySilicon|Furnace LPCVD PolySi]]) | ||
! Sputter ([[Specific Process Knowledge/Thin film deposition/Wordentec|Wordentec]]) | ! Sputter ([[Specific Process Knowledge/Thin film deposition/Wordentec|Wordentec]]) | ||
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! General description | ! General description | ||
|LPCVD (low pressure cheimical vapour deposition) of polysilicon | |LPCVD (low pressure cheimical vapour deposition) of polysilicon | ||
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|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Doping facility | ! Doping facility | ||
|Can be doped with boron or phosphorus during deposition | |Can be doped with boron or phosphorus during deposition | ||
|None | |None | ||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! Pre-clean | ! Pre-clean | ||
|New wafers can go directly into the furnace. Processed wafers have to be RCA cleaned | |New wafers can go directly into the furnace. Processed wafers have to be RCA cleaned | ||
|RF Ar clean | |RF Ar clean | ||
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|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Layer thickness | ! Layer thickness | ||
|~50Å to 2µm, if thicker layers are needed please ask the furnace team. | |~50Å to 2µm, if thicker layers are needed please ask the furnace team. | ||
|10Å to about 3000Å | |10Å to about 3000Å | ||
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! Deposition rate | ! Deposition rate | ||
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*undoped, boron doped:~100Å/min | *undoped, boron doped:~100Å/min | ||
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! Process temperature | ! Process temperature | ||
|560 <sup>o</sup>C (amorph) and 620 <sup>o</sup>C (poly) | |560 <sup>o</sup>C (amorph) and 620 <sup>o</sup>C (poly) | ||
|? | |? | ||
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! Step coverage | ! Step coverage | ||
|Good | |Good | ||
|. | |. | ||
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! Adhesion | ! Adhesion | ||
|Good for fused silica, silicon oxide, silicon nitride, silicon | |Good for fused silica, silicon oxide, silicon nitride, silicon | ||
|. | |. | ||
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! Batch size | ! Batch size | ||
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*1-30 wafers (4" furnace) | *1-30 wafers (4" furnace) | ||
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! Allowed substrates | ! Allowed substrates | ||
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* Silicon wafers (new or RCA cleaned) | * Silicon wafers (new or RCA cleaned) | ||
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! Allowed material | ! Allowed material | ||
| Only those above (under allowed substrates). | | Only those above (under allowed substrates). | ||
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! Comment | ! Comment | ||
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Revision as of 10:00, 19 September 2016
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PolySilicon can be deposited in several Danchip tools. Either it can be sputtered or be deposited in the PolySilicon furnace. In the chart below you can compare the two different deposition methods:
Deposition of PolySilicon using LPCVD
Danchip has two furnaces for deposition of LPCVD (Low Chemical Vapour Deposition) polysilicon: A 6" furnace (installed in 2011) for deposition of standard polySi, amorphous polySi and boron doped polySi on 100 mm or 150 mm wafers and a 4" furnace (installed in 1995) for deposition of standard polySi, amorphous polySi, boron- and phosphorous doped polySi on 100 mm wafers. In LabManager the two furnaces are named "Furnace: LPCVD Poly-Si (4") (B4)" and "Furnace: LPCVD Poly-Si (6") (E2)", respectively.
- Deposition of polysilicon using the 4" polysilicon furnace
- Deposition of polysilicon using the 6" polysilicon furnace
Deposition of Silicon using sputter deposition technique
At DANCHIP you can also deposit silicon using Wordentec, PVD co-sputter/evaporation or IBE Ionfab300 sputter systems. (There is also a Si sputter target in Alcatel, but the process is not running stable nowadays). One of the advantages here is that you can deposit on any material you like.
Comparison of the methods for deposition of Silicon
4" and 6" Furnace PolySi (Furnace LPCVD PolySi) | Sputter (Wordentec) | Sputter (IBE/IBSD Ionfab 300) | Sputter (Alcatel) | Sputter (Lesker) | E-beam evaporation (III-V Dielectric evaporator) | |
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General description | LPCVD (low pressure cheimical vapour deposition) of polysilicon | Sputter deposition of Si. | Ion beam sputter deposition of Si. | Sputter deposition of Si. Not recommended as first choice for Si deposition. | Sputter deposition of Si. | E-beam evaporation of Si. |
Doping facility | Can be doped with boron or phosphorus during deposition | None | None | None | None | None |
Pre-clean | New wafers can go directly into the furnace. Processed wafers have to be RCA cleaned | RF Ar clean | None | RF Ar clean | RF Ar clean | |
Layer thickness | ~50Å to 2µm, if thicker layers are needed please ask the furnace team. | 10Å to about 3000Å | No defined limits | 10Å to 2000Å | 10Å to 2500Å | |
Deposition rate |
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In the order of 1 Å/s, but dependendt on process parameters. See more here. |
About 5 nm/min. See more here. | 2Å/s to 8Å/s (see below). | Depends on process parameters, roughly 1 Å/s. | 1Å/s to 5Å/s (see below). |
Process temperature | 560 oC (amorph) and 620 oC (poly) | ? | Platen: 5-60 oC | ? | Wafers can be heated to 100-200°C | 20-250 oC |
Step coverage | Good | . | Not known | Poor | Poor | |
Adhesion | Good for fused silica, silicon oxide, silicon nitride, silicon | . | Not tested | Bad for pyrex, for other materials we do not know | ||
Batch size |
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Allowed substrates |
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Allowed material | Only those above (under allowed substrates). |
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Comment | The system is used both for IBSD and IBE. Si deposition can only be performed when it is set up for IBSD. | This process is not running really stable nowadays. |