Specific Process Knowledge/Characterization/XPS/XPS elemental composition: Difference between revisions
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=Elemental composition analysis= | =Elemental composition analysis= | ||
[[ | [[File:Overview spectra Labadvisor.JPG|600px|XPS spectrum of a sample consisting of the elements silicon, oxygen and carbon. ]] | ||
Each element give a specific "finger-print" in the XPS spectrum. The binding energy of the electrons in atoms are different for all elements, and when measuring a photoelectron spectrum over a wide range of energies, the main line from each element will be placed at a specific energy in the spectrum. | Each element give a specific "finger-print" in the XPS spectrum. The binding energy of the electrons in atoms are different for all elements, and when measuring a photoelectron spectrum over a wide range of energies, the main line from each element will be placed at a specific energy in the spectrum. | ||
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[[image:Overview spectra Labadvisor.JPG|600x600px|left|thumb|XPS spectrum of a sample consisting of the elements silicon, oxygen and carbon.]] | |||