LabAdviser/314/Microscopy 314-307/TEM/T20/STEM: Difference between revisions

Revision as of 12:00, 24 March 2020

Scanning TEM: <br\> By using STEM and a high angle annular dark field detector (HAADF), it is possible to form images where the contrast is directly related to the atomic number (z-contrast image).

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