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A general schematic of a transmission electron microscope can be found [[Specific Process Knowledge/Characterization/Tecnai TEM/Schematic|here]]
A general schematic of a transmission electron microscope can be found [[Specific Process Knowledge/Characterization/Tecnai TEM/Schematic|here]]
A general schematic of a transmission electron microscope can be found [[/Schematic|here]]


= Sample holders =
= Sample holders =

Revision as of 10:17, 26 July 2016


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Tecnai TEM

Tecnai TEM in building 314.

CEN’s Tecnai is a transmission electron microscope (TEM) used for performing both conventional, high resolution and scanning transmission microscopy (STEM) measurements. It is a versatile instrument, ideal for studying a wide range of general and advanced materials, soft matter, composites, etc. The microscope is equipped to carry out chemical analysis as well as Cryo-TEM for soft materials.

The Tecnai TEM is a transmission electron microscope equipped with a thermionic electron source with a Lab6 filament and acceleration voltages that can vary between 80-200 kV. This gives the microscope a resolution @ 200 kV of 1.4 Å in TEM mode. Other tecniques available on the microscope are scanning transmission electron microscopy (STEM, resolution 10 Å) with a high-angle annular dark-field detector (HAADF).

On the analytical side, the microscope is equipped with an Oxford X-Max SDD X-ray detector for Energy Dispersive X-ray (EDX) spectroscopy and a Gatan Tridiem 863 imaging filter allowing for electron energy-loss spectroscopy (EELS) and energy-filtered imaging. For imaging, the microscope is equipped with Gatan US1000 CCD cameras before and after the energy filter.

TEM Schematic

A general schematic of a transmission electron microscope can be found here A general schematic of a transmission electron microscope can be found here

Sample holders

The default specimen holder for the Tecnai TEM is called Single-Tilt (FEI ST) and it is always present in the Tecnai room.
The lab has also other specimen holders used for various application e.g. heating (furnace and MEMS-based), cooling, biasing and tomography. For information on the various specimen holders see HERE

Who may operate the TEM Tecnai

Anybody in need of a TEM microscope is welcome to apply for access to our facility by submitting an Access Request Form .Shortly after your ARF has been received you will be contact by the technical support team in order to set up a meeting to further discuss your application.
In order to be authorised to use the Tecnai TEM you must compete the Tecnai training with consists of a theoretical lecture and 3 practical sessions of 4 hours each.
Due to the similarity of the basic operations on a Tecnai TEM and a Titan TEM, a Tecnai trained user can receive additional training and progress in using a Titan TEM.
When you have demonstrated a high level of familiarity with the Tecnai TEM you will be authorized and allowed to book it via our booking system called LabManager.

Booking Rules

Tecnai Booking rules can be found here

Contact information can be found in LabManager

TEM Tecnai in LabManager

Process/ Technique information

Comparison between TEMs at DTU Cen

Microscope

T12

T20

ATEM

ETEM

Purpose
  • TEM characterization
  • Spectroscopic charaterization
  • TEM characterization
  • STEM characterization
  • Spectroscopic charaterization
  • High-resolution STEM imaging
  • Analytical microscopy
  • Holography
  • High-resolution TEM imaging
  • ETEM experiments
  • Spectroscopic charaterization
Resolution TEM mode

>3.5 Å

1.44 Å

1.02 Å

0.9 Å

STEM mode

no STEM

about 10 Å

0.8 Å

1.36 Å

Spectroscopy EDX

Oxford X-Max 80T/AZtec

Oxford X-Max 80T/AZtec

Oxford X-Max 100TLE/AZtec

Oxford X-Max 80T/AZtec

EELS

no EELS

Gatan 863 Tridiem GIF

Gatan 865 Tridiem GIF

Gatan 866 Tridiem GIF


Reference material

Books:

L. Reimer, Transmission Electron Microscopy - Physics of image formation and microanalysis (Springer, 1997).

David B. Williams, C. Barry Carter, Transmission Electron Microscopy - A Textbook for Materials Science (Springer, 2009).

Online Material:

Tutorials in Transmission Electron Microscopy by John Rodenburg

TEM Basics by University of Liverpool

TEM Introduction by ammrf