Specific Process Knowledge/Characterization/XPS/Processing/Basics: Difference between revisions

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## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Manually_add_peaks_to_identification_of_survey_spectra|Manual ID]]
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Manually_add_peaks_to_identification_of_survey_spectra|Manual ID]]
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Make_a_depth_profile_from_survey_spectrum|Depth profile]]
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro#Make_a_depth_profile_from_survey_spectrum|Depth profile]]
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|High resolution spectra analysis]]
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|High resolution spectra analysis]]
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres#Selecting_high_resolution_spectra_for_peak_fitting|Open spectra]]
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres#Selecting_high_resolution_spectra_for_peak_fitting|Open spectra]]
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## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres#Verify_correctness_of_fitting_routine|Ensure correct fitting parameters]]
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres#Verify_correctness_of_fitting_routine|Ensure correct fitting parameters]]
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres#Change_fitting_constraints|Apply constraints]]
## [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres#Change_fitting_constraints|Apply constraints]]
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/3fitting|Complete the analysis]]
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/3fitting|Complete the analysis]]

Revision as of 14:52, 27 June 2016

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XPS data processing guide

This section is intended as an introduction to the analysis of XPS data. Simple examples are chosen to illustrate the procedures. All actions performed with Avantage (version 5.498) during an analysis of a sample are shown.

In case you want to follow along with your own analysis, you can download the data from here (this file is a .zip file that has been renamed to .doc in order to be uploaded to LabAdviser, so download and rename to .zip and extract the files)

  1. Survey spectra analysis
    1. Open data
    2. Spectrum views
    3. View of data with several levels
    4. Zooming
    5. Automatic peak ID
    6. Manual ID
    7. Depth profile
  2. High resolution spectra analysis
    1. Open spectra
    2. Peak fitting
    3. Ensure correct fitting parameters
    4. Apply constraints
  3. Complete the analysis
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