Specific Process Knowledge/Characterization/XPS/Processing/Basics: Difference between revisions

From LabAdviser
← Older editNewer edit →
VisualWikitext
Jmli (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
4,400 edits
Jmli (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
4,400 edits
Line 8: Line 8:
In case you want to follow along with your own analysis, you can download the data from [[Media:20150518_ZnO_CuZn_ZnO.doc| here (this file is a .zip file that has been renamed to .doc in order to be uploaded to LabAdviser, so download and rename to .zip and extract the files)]]
In case you want to follow along with your own analysis, you can download the data from [[Media:20150518_ZnO_CuZn_ZnO.doc| here (this file is a .zip file that has been renamed to .doc in order to be uploaded to LabAdviser, so download and rename to .zip and extract the files)]]


# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro|Open data, spectrum views, depth profile, survey spectrum peak identification, click here]]
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro|Survey spectra analysis: Open data, spectrum views, depth profile, survey spectrum peak identification, click here]]
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|Open high resolution spectra, add background and peaks, apply constraints to fitting]]
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|High resolution spectra analysis: Open spectra, add background and peaks, apply constraints to fitting]]
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/3fitting|Complete the analysis]]
 
 
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro|Survey spectra analysis: Open data, spectrum views, depth profile, survey spectrum peak identification, click here]]
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|High resolution spectra analysis: Open spectra, add background and peaks, apply constraints to fitting]]
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/3fitting|Complete the analysis]]
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/3fitting|Complete the analysis]]

Revision as of 10:14, 27 June 2016

Feedback to this page: click here

XPS data processing guide

This section is intended as an introduction to the analysis of XPS data. Simple examples are chosen to illustrate the procedures. All actions performed with Avantage (version 5.498) during an analysis of a sample are shown.

In case you want to follow along with your own analysis, you can download the data from here (this file is a .zip file that has been renamed to .doc in order to be uploaded to LabAdviser, so download and rename to .zip and extract the files)

  1. Survey spectra analysis: Open data, spectrum views, depth profile, survey spectrum peak identification, click here
  2. High resolution spectra analysis: Open spectra, add background and peaks, apply constraints to fitting
  3. Complete the analysis


  1. Survey spectra analysis: Open data, spectrum views, depth profile, survey spectrum peak identification, click here
  2. High resolution spectra analysis: Open spectra, add background and peaks, apply constraints to fitting
  3. Complete the analysis
Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=Specific_Process_Knowledge/Characterization/XPS/Processing/Basics&oldid=24210"