LabAdviser/314/Preparation 314-307: Difference between revisions
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2) Fischione NanoMill model 1040. | 2) Fischione NanoMill model 1040. This TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens. | ||
[http://www.fischione.com/products/ion-beam-preparation/model-1040-nanomill%C2%AE-tem-specimen-preparation-system Operation Manual] | [http://www.fischione.com/products/ion-beam-preparation/model-1040-nanomill%C2%AE-tem-specimen-preparation-system Operation Manual] | ||