Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy/samplemount: Difference between revisions
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; Limit cross contamination issues | ; Limit cross contamination issues | ||
: Sticking your sample onto carbon pad that is already sitting on a pin stub is a very fast way to get started - but it is not a very clever one. Using old carbon pads has many disadvantages: | : Sticking your sample onto carbon pad that is already sitting on a pin stub is a very fast way to get started - but it is not a very clever one. Using old carbon pads has many disadvantages: | ||
* The electrical conductivity of the carbon pad degrades over time and you will have charging problems | ** You don't know what kind of samples have already been mounted so once your sample has been contact with an old carbon pad, it should be regarded as contaminated with anything. | ||
** The electrical conductivity of the carbon pad degrades over time and you will have charging problems. | |||
; Optimize imaging conditions hence image quality. | ; Optimize imaging conditions hence image quality. | ||
: Poorly mounted samples are much more likely to vibrate or charge. | : Poorly mounted samples are much more likely to vibrate or charge. | ||
Respect the guidelines on sample mounting in the next sections and you will maximize the results of your efforts at the SEM. | Respect the guidelines on sample mounting in the next sections and you will maximize the results of your efforts at the SEM. | ||