Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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*[[/Workspaces|What experiment and probe to select]] | *[[/Workspaces|What experiment and probe to select]] | ||
*[[Media:2014 Advanced AFM Applications Training Class_Image Quality&PeakForce Tapping.pdf|Bruker introduction to contact mode, tapping mode and peak force tapping mode + how to improve image quality]] | *[[Media:2014 Advanced AFM Applications Training Class_Image Quality&PeakForce Tapping.pdf|Bruker introduction to contact mode, tapping mode and peak force tapping mode + how to improve image quality]] | ||
*[[/KPFM|KPFM measurements - work function]] | |||
==An overview of the performance of the AFM Icon== | ==An overview of the performance of the AFM Icon== | ||