Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions

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-|-style="background:WhiteSmoke; color:black"
+|style="background:LightGrey; color:black" rowspan="2" align="center" |Resolution
-!Instrument resolution
+|style="background:Whitesmoke; color:black" colspan="5" align="center"| The resolution of a SEM is strongly dependent on sample type and the operator. Resolution quoted is using sputtered gold on carbon
+|-
 |A
 |B