Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions
| Line 229: | Line 229: | ||
|- | |- | ||
|-style="background:silver; color:black" | |-style="background:silver; color:black" | ||
! | ! Equipment | ||
![[Specific Process Knowledge/Characterization/SEM Inspect S|SEM Inspect S]] | ![[Specific Process Knowledge/Characterization/SEM Inspect S|SEM Inspect S]] | ||
![[Specific Process Knowledge/Characterization/SEM FEI Nova 600 NanoSEM|SEM FEI Nova 600 NanoSEM]] | ![[Specific Process Knowledge/Characterization/SEM FEI Nova 600 NanoSEM|SEM FEI Nova 600 NanoSEM]] | ||
| Line 355: | Line 355: | ||
!Max sample size | !Max sample size | ||
|Consult with CEN staff as weight, dimensions, pumping capacity and technique all play a roll in the sample size | |Consult with CEN staff as weight, dimensions, pumping capacity and technique all play a roll in the sample size | ||
|- | |- | ||
|} | |} | ||
<br clear="all" /> | <br clear="all" /> | ||