Specific Process Knowledge/Thin film deposition/ALD Picosun R200: Difference between revisions
Appearance
| Line 38: | Line 38: | ||
*[[/Al2O3 deposition using ALD|Al<sub>2</sub>O<sub>3</sub> deposition using ALD]] | *[[/Al2O3 deposition using ALD|Al<sub>2</sub>O<sub>3</sub> deposition using ALD]] | ||
*[[/TiO2 deposition using ALD|TiO<sub>2</sub> deposition using ALD]] | *[[/TiO2 deposition using ALD|TiO<sub>2</sub> deposition using ALD]] | ||
*[[/Advanced recipies involving Al<sub>2</sub>O<sub>3</sub>&TiO<sub>2</sub> | *[[/ALD multilayers|Advanced recipies involving Al<sub>2</sub>O<sub>3</sub>&TiO<sub>2</sub> multilayers]] | ||
==Equipment performance and process related parameters== | ==Equipment performance and process related parameters== | ||