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Specific Process Knowledge/Characterization/SEM LEO: Difference between revisions

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*[[Specific Process Knowledge/Lithography/EBeamLithography/RaithElphy|Raith Elphy e-beam lithography system]]
*[[Specific Process Knowledge/Lithography/EBeamLithography/RaithElphy|Raith Elphy e-beam lithography system]]


===Typical current values===
Reported values are the average of five measurements from Elphy Quantum using the EBL holder's Faraday cup. All values in pA.
{| border="1" style="text-align: center; width: 320px; height: 200px;"
|-
|colspan="6" style="text-align: center;" style="background: #efefef;" | '''LEO - Current measurements 11/02/2017'''
|-
!scope="row" | 
!|5kV
!|10kV
!|15kV
!|20kV
|-
|-
!10um
|13
|17
|20.5
|25
|-
|-
!20um
|62
|87
|105
|127
|-
|-
!30um
|160
|175
|215
|264
|-
!60um
|510
|680
|850
|1040
|}


==Equipment performance==
==Equipment performance==