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Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions

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|style="background:LightGrey; color:black" align="center" | Imaging and measurement of
|style="background:LightGrey; color:black" align="center" | Imaging and measurement of
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
* Any (semi)conducting sample that may have thin (~ 5 µm <) layers of non-conducting materials on top
* Conducting samples
* Semi-conducting samples
* Thin (~ 5 µm <) layers of non-conducting materials such as polymers
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
* Any sample except bulk insulators such as polymers, glass or quartz wafers
* Any sample except bulk insulators such as polymers, glass or quartz wafers
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