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Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions

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DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
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Pevo (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
2,366 edits
Line 137: Line 137:
* T: -10 to 70<sup>o</sup>  
* T: -10 to 70<sup>o</sup>  
* R: 360<sup>o</sup>  
* R: 360<sup>o</sup>  
* Z: XXX mm
* Z: 50 mm
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* X, Y: 130 &times; 130 mm
* X, Y: 130 &times; 130 mm
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| style="background:LightGrey; color:black" align="center" |Allowed materials
| style="background:LightGrey; color:black" align="center" |Allowed materials
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|style="background:WhiteSmoke; color:black"|
* Any standard cleanroom material except graphene or CNT samples
* Any standard cleanroom materials
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* Any standard cleanroom material except graphene or CNT samples
* Any standard cleanroom material and samples from the Laser Micromachining tool and the Polymer Injection Molding tool
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|style="background:WhiteSmoke; color:black"|
* Any standard cleanroom material except graphene or CNT samples
* Any standard cleanroom materials
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
* Any standard cleanroom material including graphene or CNT samples
* Any standard cleanroom materials
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<!--|style="background:WhiteSmoke; color:black"|
* Conductive materials
* Conductive materials
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