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Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions

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DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
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Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,317 edits
Line 255: Line 255:
|-
|-
|-style="background:WhiteSmoke; color:black"
|-style="background:WhiteSmoke; color:black"
!Generel description
!Purpose
|Generel description - method 1
|A
|Generel description - method 2
|B
|Generel description - method 3
|C
|Generel description - method 4
|D
|Generel description - method 5
|E
|-
|-


|-
|-
|-style="background:LightGrey; color:black"
|-style="background:LightGrey; color:black"
!Parameter 1
!Equipment position
|
|CEN A
*A
|CEN B
*B
|CEN C
|
|CEN D
*A
|CEN E
*B
|-
|-


|-
|-
|-style="background:WhiteSmoke; color:black"
|-style="background:WhiteSmoke; color:black"
!Parameter 2
!Instrument resolution
|
|A
*A
|B
*B
|C
*C
|D
|
|E
*A
|-
|-


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