Specific Process Knowledge/Lithography/Coaters: Difference between revisions
Appearance
| Line 288: | Line 288: | ||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
|Silicon with native oxide | |Silicon with native oxide | ||
| Line 303: | Line 294: | ||
|2,4% | |2,4% | ||
|12/15 2015 | |12/15 2015 | ||
|chasil | |||
|with HMDS. Average of 3 wafers | |||
|- | |||
|Silicon with native oxide | |||
|1,399 | |||
|3,1% | |||
|28/1 2016 | |||
|chasil | |chasil | ||
|with HMDS. Average of 3 wafers | |with HMDS. Average of 3 wafers | ||