Jump to content

Specific Process Knowledge/Etch/Etching of Silicon Nitride: Difference between revisions

Bghe (talk | contribs)
Mbec (talk | contribs)
Line 36: Line 36:
|
|
*Isotropic etch
*Isotropic etch
*Well suited for removing all nitride on a wafer surface (nitride strip) without a mask. High selectivity Si<sub>3</sub>N<sub>4</sub>/Si (>100) and Si<sub>3</sub>N<sub>4</sub>/SiO<sub>2</sub> (>20) @ 180 C.
*Well suited for removing all nitride on a wafer surface (nitride strip) without a mask. High selectivity Si<sub>3</sub>N<sub>4</sub>/Si (>100) and Si<sub>3</sub>N<sub>4</sub>/SiO<sub>2</sub> (>20) @ 160 C.
|
|
*Isotropic etch
*Isotropic etch
Line 88: Line 88:
!Etch rate range
!Etch rate range
|
|
*Si<sub>3</sub>N<sub>4</sub> @ 180 <sup>o</sup>C: ~84 Å/min
*Si<sub>3</sub>N<sub>4</sub> @ 160 <sup>o</sup>C: ~60 Å/min
*Si<sub>3</sub>N<sub>4</sub> @ 160 <sup>o</sup>C: ~60 Å/min
|
|